FERROELASTIC DOMAIN STUDY BY ATOMIC-FORCE MICROSCOPE (AFM)

Citation
As. Bhalla et al., FERROELASTIC DOMAIN STUDY BY ATOMIC-FORCE MICROSCOPE (AFM), Materials letters, 35(1-2), 1998, pp. 28-32
Citations number
19
Categorie Soggetti
Material Science","Physics, Applied
Journal title
ISSN journal
0167577X
Volume
35
Issue
1-2
Year of publication
1998
Pages
28 - 32
Database
ISI
SICI code
0167-577X(1998)35:1-2<28:FDSBAM>2.0.ZU;2-Y
Abstract
In the present study, the authors have employed, for the first time, A FM for observing the surfaces of ferroelastic materials. Studies of fe rroelectric/ferroelastic domains are important for understanding the d evices based on acousto-optic and opto-electronic properties and the a ging behavior of the ferroelectric/ferroelastic crystals. This paper r eports the first such study of domains on the ferroelastic lend vanada te crystal surface. Both stripes and needle-shaped domains are observe d. The typical width of the tip of needle domains is similar to 100 An gstrom. Sharp and round tips of needles have been detected very clearl y with developed surface features. (C) 1998 Elsevier Science B.V.