The presence of face centered cubic Ti and Zr in Zr/Ti multilayers in
specimens prepared for transmission electron microscopy is noted. X-ra
y diffraction shows that in the as-deposited state the multilayers con
tain the equilibrium hcp Ti and Zr phases. implying that a transformat
ion occurs during thinning of specimens for TEM study. (C) 1998 Elsevi
er Science B.V.