The structure of a hard a-C:Si:H deposited by RF reactive sputtering f
rom a graphite target in an argon-silane atmosphere is analysed. It is
shown that Si and C atoms are intermixed and form a rigid network. Th
e details of the deposition process are discussed and the crucial role
of argon evidenced. Argon atoms dehydrogenate silane to form SiH grou
ps, which have a high sticking coefficient and a low surface mobility.
These groups become centres of nucleation. The energy of argon ions i
mpinging on the growing surface is important in determining a good int
ermixing of carbon and silicon and the removal of voids. (C) 1997 Else
vier Science S.A.