Mf. Plass et al., GROWTH AND CHARACTERIZATION OF BORON-NITRIDE FILMS - LAYER SEQUENCE AND PHASE IDENTIFICATION, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 594-598
Boron nitride films were deposited using ion beam assisted deposition
and examined with polarised infrared reflection spectroscopy. Using th
is technique, in addition to the cubic phase, two different non-cubic
modifications, layered anisotropic and amorphous, can be distinguished
. Comparison of the spectra of c-BN containing films with model calcul
ations fields a depth resolved determination of the Various layers and
the cubic content of the top layer. Further insights into the c-BN gr
owth process, in particular of the alteration mechanism between h-BN a
nd c-BN, can be obtained, in contrast to the established infrared peak
ratio. (C) 1997 Elsevier Science S.A.