R. Hattori et al., INTERNAL FIELD-EMISSION AT METAL DIAMOND CONTACT AND PERFORMANCE OF THIN-FILM FIELD EMITTERS - COMPUTER-SIMULATION/, DIAMOND AND RELATED MATERIALS, 6(5-7), 1997, pp. 884-888
Emission characteristics of metal/diamond (insulating or donor-doped)
contact Geld emitters have been calculated. In the calculation, Fowler
-Nordheim type electron tunneling including Schottky effect and contin
uity of current, when needed, are taken into account. When the diamond
layer is insulating or of low donor concentration, the emission perfo
rmance is not satisfactorily improved in comparison with conventional
metal field emitters, because the unfavorable reduction (1/5.7) in the
interfacial electric field due to the dielectric nature of diamond is
adverse to the favorable effect of possible decrease in barrier heigh
t (typically from 5 to 2eV). However, when the donor density is suffic
iently high, the space-charge effect in Che donor-doped diamond layer
can enhance the interfacial electric field leading to a high emission
current. The thickness of the diamond film in this case is preferable
to be close to the space-charge Iayer width. Too much reduction of the
diamond layer thickness may lose the advantage of utilizing space-cha
rge effect of ionized donors. The possibility of diamond metal/insulat
or/metal (MIM) field emitters with negative work function at the face
metal is also discussed in comparison with conventional MIM vacuum emi
tters proposed so far. (C) 1997 Elsevier Science S.A.