The possibility to use multilayer structures based entirely on carbon
films as reflecting coatings for S-ray optics elements is analyzed. Th
e structures grown by plasma deposition technique contained up to 100
superthin supersmooth layers. It is shown that the X-ray interference
can be observed in such structures. Parameters of multilayer structure
s consisting of superthin carbon layers were calculated fur various wa
velengths in the soft X-ray range. It is shown that the reflection coe
fficient of such structures is comparable to that of traditional Me/Me
, Me/Si, and Me/C X-ray mirrors but the resolution is greater by a fac
tor of 2-3. Samples of X-ray mirrors were made and their characteristi
cs measured. (C) 1997 Elsevier Science S.A.