ELECTRONIC-STRUCTURE OF SI(113)2X2-CS SURFACE STUDIED BY ARUPS

Citation
Ks. An et al., ELECTRONIC-STRUCTURE OF SI(113)2X2-CS SURFACE STUDIED BY ARUPS, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 701-706
Citations number
16
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
88
Year of publication
1998
Pages
701 - 706
Database
ISI
SICI code
0368-2048(1998)88:<701:EOSSSB>2.0.ZU;2-U
Abstract
The electronic structure of a Si(113)2 x 2-Cs surface has been investi gated by low energy electron diffraction (LEED) and angle-resolved ult raviolet photoelectron spectroscopy (ARUPS). The surface-band dispersi ons were measured along the symmetry axes, Gamma-U[33(2) over bar] and Gamma-W[1(1) over bar0$], in the surface Brillouin zone. Three surfac e states were observed at the binding energy of 0.7 (A(1)), 0.95 (A(2) ). and 1.65 eV (A(3)) below the Fermi level at Gamma with overall disp ersions of about 0.15, 0.5, and 0.2 eV, respectively. The A(2) and A(3 ) states revealed a 2 x 2 periodicity along the [33(2) over bar] direc tion. Considering the alkali-metal adsorptions on low-index Si surface s and measured Cs 3d/Si 2p XPS peak intensity ratios, the Cs-saturatio n coverage of the 2 x 2-Cs surface was assigned to about 6/8 monolayer . Based on the Cs-saturated adatom + tetramer model, the A(1) and A(2) states are identified as Cs-induced adatom and tetramer states, respe ctively. The A(3) State has a surface resonance-like character. (C) 19 98 Elsevier Science B.V.