G. Lelay et al., SURFACE CORE-LEVEL SHIFTS OF SI(111)7X7 - A CRITICAL-EVALUATION OF THE SI 2P ANALYSIS, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 711-715
Three different teams have recently measured Si 2p high resolution syn
chrotron radiation spectra from the 'prototypical' 7 x 7 reconstructio
n of the clean Si(lll) surface. Although nearly identical line shapes
were obtained, the model functions used in the analysis were rather di
fferent, leading to somewhat dubious attributions of each surface shif
ted component to a specific stuctural building block of the 7 x 7 reco
nstruction. To objectively test these model functions we compare the c
urve synthesis resulting from a new set of high resolution spectra acq
uired independently. This comparison favors the model with five surfac
e shifted components and consequently supports the corresponding assig
nments. (C) 1998 Elsevier Science B.V.