FAST ELEMENTAL MAPPING AND MAGNETIC IMAGING WITH HIGH LATERAL RESOLUTION USING A NOVEL PHOTOEMISSION MICROSCOPE

Citation
C. Ziethen et al., FAST ELEMENTAL MAPPING AND MAGNETIC IMAGING WITH HIGH LATERAL RESOLUTION USING A NOVEL PHOTOEMISSION MICROSCOPE, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 983-989
Citations number
10
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
88
Year of publication
1998
Pages
983 - 989
Database
ISI
SICI code
0368-2048(1998)88:<983:FEMAMI>2.0.ZU;2-2
Abstract
Using tunable soft X-ray synchrotron radiation and a new-generation ph otoemission electron microscope with integral sample stage and microar ea selector, elemental images and local XANES spectra have been measur ed. Given the present conditions (PM3 at BESSY), the lateral resolutio n was in the range of 130 nm with the potential of considerable improv ement with high-brilliance sources (a base resolution of 25 nm was obt ained in threshold photoemission). Measurements at the oxygen K-edge d emonstrate that differences in the local chemical environment of the e mitter atom are clearly revealed and can thus be used as a fingerprint technique for its chemical state and geometrical surroundings. By exp loiting the magnetic circular dichroism effect it was possible to view magnetic domains and domain walls. (C) 1998 Elsevier Science B.V.