HIGH-RESOLUTION PHOTOEMISSION COMBINED WITH LOW-TEMPERATURE STM

Citation
H. Hovel et al., HIGH-RESOLUTION PHOTOEMISSION COMBINED WITH LOW-TEMPERATURE STM, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 1015-1020
Citations number
21
Categorie Soggetti
Spectroscopy
ISSN journal
03682048
Volume
88
Year of publication
1998
Pages
1015 - 1020
Database
ISI
SICI code
0368-2048(1998)88:<1015:HPCWLS>2.0.ZU;2-X
Abstract
A novel low-temperature (LT) surface-science facility based on a two-c hamber UHV system has been developed for combined investigations of th e electronic and geometric structure of surfaces, employing scanning t unneling microscopy at T less than or equal to 5 K and high-resolution (Delta E congruent to 10 meV) photoemission at T less than or equal t o 50 K. A LHe-cooled sample manipulator enables cold transfer of sampl es (and tips) between the two chambers. Here we present the LT-UHV fac ility together with first measurements on silver surfaces and silver c lusters prepared in nanopits of a graphite surface. (C) 1998 Elsevier Science B.V.