H. Hovel et al., HIGH-RESOLUTION PHOTOEMISSION COMBINED WITH LOW-TEMPERATURE STM, Journal of electron spectroscopy and related phenomena, 88, 1998, pp. 1015-1020
A novel low-temperature (LT) surface-science facility based on a two-c
hamber UHV system has been developed for combined investigations of th
e electronic and geometric structure of surfaces, employing scanning t
unneling microscopy at T less than or equal to 5 K and high-resolution
(Delta E congruent to 10 meV) photoemission at T less than or equal t
o 50 K. A LHe-cooled sample manipulator enables cold transfer of sampl
es (and tips) between the two chambers. Here we present the LT-UHV fac
ility together with first measurements on silver surfaces and silver c
lusters prepared in nanopits of a graphite surface. (C) 1998 Elsevier
Science B.V.