Self-stopping, selective oxidation of AlAs was demonstrated. Lateral o
xidation was stopped where the thickness of AlAs was decreased from 30
to 15 nm because of the large stress arising from the layer boundary
of the oxidized AlAs and the surrounding GaAs. The thickness could be
varied without degrading the wafer quality by in situ selective growth
using the masked molecular beam epitaxy method, which will be availab
le to make oxidized vertical cavity surface emitting lasers uniformly
and repeatedly. (C) 1998 American Institute of Physics.