The atomic and electronic structure for a (1210) prismatic stacking fa
ult in GaN is calculated from first principles. The fault vector is 1/
2[1011]. Such a fault is believed to occur when GaN is grown on sapphi
re or SiC, and may originate when basal plane stacking faults fold ont
o the prism plane. We find that the boundary is heavily reconstructed,
but that the atoms remain fourfold coordinated, with no wrong bonds o
r dangling bonds present. Despite the existence of distorted four-memb
ered rings of bonds at the boundary, the fault does not induce deep st
ates inside the gap. The calculated stacking fault energy is 72 meV/An
gstrom(2). (C) 1998 American Institute of Physics.