CRYSTALLIZATION PROCESS OF SR0.7BI2.3TA2O9 THIN-FILMS WITH DIFFERENT CRYSTAL ORIENTATION PREPARED BY CHEMICAL LIQUID DEPOSITION USING ALKOXIDE PRECURSOR
I. Koiwa et al., CRYSTALLIZATION PROCESS OF SR0.7BI2.3TA2O9 THIN-FILMS WITH DIFFERENT CRYSTAL ORIENTATION PREPARED BY CHEMICAL LIQUID DEPOSITION USING ALKOXIDE PRECURSOR, IEICE transactions on electronics, E81C(4), 1998, pp. 552-559
The crystallization process of Sr0.7Bi2.3Ta2O9 (SBT) ferroelectric thi
n films with different crystal orientations formed by chemical liquid
deposition using an alkoxide precursor was investigated. One film show
ed strong c-axis orientation (a-type him), while another shows scarcel
y any c-axis orientation (b-type film). We report that the crystalliza
tion process was the same even when crystal orientation differed. Thin
films first change from amorphous to fluorite fine grains; the fluori
te grains then change to bismuth layer-structure grains. The different
orientation of the SBT films is not caused by different crystallizati
on process. Both SBT films with different crystal orientations consist
of fine fluorite grains after 650 degrees C heat-treatment. Their lea
kage current density characteristics differ, however. The leakage curr
ent density of the a-type film was independent of the electric field,
and showed a low value of 10(-8)/cm(2). The leakage current density of
the b-type film, however, was dependent on the electric field, and in
creased continuously with the increasing electric field. After 700 deg
rees C heat-treatment, both films consist of large grains with bismuth
layer-structure and fine fluorite grains. The matrix of both films co
ntains large grains with bismuth layer-structure that determines the l
eakage current density characteristics. Since the fluorite grain size
after a 700 degrees C heat-treatment is the same as that after 650 deg
rees C heat-treatment, nucleation is predominant at the structural pha
se boundary from amorphous to fluorite. The bismuth layer-structure gr
ains are large and single-crystal grains after both a 700 and 800 degr
ees C heat-treatment. Increased grain size predominates at the structu
ral phase boundary from fluorite to bismuth layer-structure grains. Cl
early, Ferroelectric SBT films with bismuth layer-structure are crysta
llized in two steps, each having a different predominant crystal growt
h mechanism.