C. Pic et al., SPECTROSCOPIC STUDY OF A SPECTRALLY SENSITIZED TABULAR GRAIN AGBR EMULSION USING BOTH AFM AND PSTM TECHNIQUES, Journal of imaging science and technology, 42(2), 1998, pp. 126-134
The scope of this study was to correlate the topographic information p
rovided by atomic force microscopy (AFM) with optical properties of th
e AgX tabular grain photographic emulsion samples collected with near-
field optical microscopies. Images of spectrally sensitized AgBr tabul
ar grains were performed, using both AFM and photon scanning tunneling
microscopy (PSTM). PSTM images of spectrally sensitized AgBr microcry
stals, recorded at various excitation wavelengths, showed an amplifica
tion of the apparent thickness of the grains when excited in the absor
ption range of the dye. This can be explained by the contribution of t
he fluorescence of the sensitizing dye to the measured signal in the P
STM. The increase of the PSTM response depended also on the dye covera
ge and on the stack of microcrystals. The visible absorption and fluor
escence spectra of the spectrally sensitized emulsion obtained at room
temperature at a macroscopic scale were in good agreement with the PS
TM observations.