SIMULTANEOUS MEASUREMENT OF AMPLITUDE AND PHASE IN SURFACE 2ND-HARMONIC GENERATION

Citation
J. Chen et al., SIMULTANEOUS MEASUREMENT OF AMPLITUDE AND PHASE IN SURFACE 2ND-HARMONIC GENERATION, Optics letters, 23(9), 1998, pp. 676-678
Citations number
14
Categorie Soggetti
Optics
Journal title
ISSN journal
01469592
Volume
23
Issue
9
Year of publication
1998
Pages
676 - 678
Database
ISI
SICI code
0146-9592(1998)23:9<676:SMOAAP>2.0.ZU;2-4
Abstract
The intensity and the phase in surface second-harmonic generation were simultaneously measured by use of an ac optical balanced homodyne det ection system. in this system the surface second-harmonic wave was sup erimposed upon a local oscillator wave generated by a barium berate no nlinear optical crystal and then detected as an interference signal. E xtremely high sensitivity of 3 aW (6 photons/s) and high precision wer e achieved by use of a lock-in amplifier, in which an interference sig nal of fundamental waves was used as a reference signal. Simultaneous measurement of the intensity and the phase in surface second-harmonic waves generated From native-oxidized Si(111) surfaces is demonstrated. (C) 1998 Optical Society of America.