Homoepitaxial diamond Schottky diodes with leakage current less than 1
0(-7) A cm(-2) up to the breakdown voltage of 90 V are discussed. Unde
r forward voltage an exponential current increase over six orders of m
agnitude and an ideality factor of n<1.2 is observed. At elevated temp
erature, thermally activated reverse leakage currents are present as c
ommonly observed, however breakdown is not degraded. The experiments a
llow to discuss design rules for high-voltage diamond Schottky diodes.
(C) 1997 Elsevier Science S.A.