THE CHARACTERIZATION OF SINGLE STRUCTURE DIAMOND HEATER AND TEMPERATURE SENSOR

Citation
Gs. Yang et al., THE CHARACTERIZATION OF SINGLE STRUCTURE DIAMOND HEATER AND TEMPERATURE SENSOR, DIAMOND AND RELATED MATERIALS, 6(2-4), 1997, pp. 394-397
Citations number
12
Categorie Soggetti
Material Science
ISSN journal
09259635
Volume
6
Issue
2-4
Year of publication
1997
Pages
394 - 397
Database
ISI
SICI code
0925-9635(1997)6:2-4<394:TCOSSD>2.0.ZU;2-6
Abstract
Heal generation and temperature sensing, essential for most heater app lications, were achieved by using a single diamond resistor. Chemical vapor-deposited p-type diamond resistors were fabricated on polycrysta lline diamond substrates and oxidized Si wafers using diamond film tec hnology compatible with integrated circuit processing. The resistivity -temperature relationship of diamond thermistors was characterized Ln the temperature range of 300-1000 K. The maximum heating temperature a nd power density of 950 It and 93 W cm(-2), respectively, were achieve d for healing application. The average difference between the temperat ures determined by self-sensing of diamond thin film heaters and the t emperatures measured by thermocouples was in the range of 1.05-3.6%. D ue to its high thermal conductivity, the substrate temperature was iso thermal, as indicated by two-dimensional optical thermometry. (C) 1997 Elsevier Science S.A.