SCANNING ELECTROCHEMICAL MICROSCOPY - 36 - A COMBINED SCANNING ELECTROCHEMICAL MICROSCOPE QUARTZ CRYSTAL MICROBALANCE INSTRUMENT FOR STUDYING THIN-FILMS

Citation
De. Cliffel et Aj. Bard, SCANNING ELECTROCHEMICAL MICROSCOPY - 36 - A COMBINED SCANNING ELECTROCHEMICAL MICROSCOPE QUARTZ CRYSTAL MICROBALANCE INSTRUMENT FOR STUDYING THIN-FILMS, Analytical chemistry, 70(9), 1998, pp. 1993-1998
Citations number
27
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
00032700
Volume
70
Issue
9
Year of publication
1998
Pages
1993 - 1998
Database
ISI
SICI code
0003-2700(1998)70:9<1993:SEM-3->2.0.ZU;2-A
Abstract
The design of a combined scanning electrochemical microscope-quartz cr ystal microbalance (SECM-QCM) with separate potential control of the t ip and substrate is described. Both lateral and vertical tip movements near the substrate affect the QCM resonant frequency because of pertu rbations of the longitudinal and shear waves of the quartz crystal (QC ) acoustic wave sensor. The SECM-QCM was used to study etching of a th in Ag layer deposited on the QC contact by generating an etchant, iron (III) tris(bipyridine), at the tip near the surface. The SECM-QCM was also used to monitor film mass and surrounding electrolyte composition during potential cycling of a film of C-60 on an electrode.