THE ELECTRICAL-TRANSPORT OF INTERCALATED BSCCO

Citation
Jh. Lee et al., THE ELECTRICAL-TRANSPORT OF INTERCALATED BSCCO, Zhongguo wuli xuekan, 36(2), 1998, pp. 316-323
Citations number
15
Categorie Soggetti
Physics
Journal title
ISSN journal
05779073
Volume
36
Issue
2
Year of publication
1998
Part
2
Pages
316 - 323
Database
ISI
SICI code
0577-9073(1998)36:2<316:TEOIB>2.0.ZU;2-A
Abstract
The anisotropic electrical resistivity of HgBr2 intercalated Bi-2212 s ingle crystal and the electrical resistivity and thermoelectric power( TEP) of AgI, I-2 and HgI2 intercalated polycrystalline Bi-2223 are mea sured. In the normal state (T > T-c), the semiconductor-like behavior of rho c(T) of the pristine Bi2Sr2CaCu2O7, becomes metallic upon the H gBr2 intercalation, while rho(ab)(T) remains metallic. The resistivity data of the HgBr2 intercalated samples, show anomalies at T = 250 K r eminiscent of a phase transition. The results indicate that the charge transfer from HgBr2 to the CuO2 plane is important, which supports th e picture that the doping induced holes in the copper oxide sheets are responsible for the high temperature superconductivity. Meanwhile, th e intercalated polycrystalline Bi-2223 shows semiconductor-like resist ivity with two T-c about 25 K lower than that of the pristine Bi-2223 (T-c similar to 100 K). The magnitude of TEP increases upon intercalat ion, which indicates the charge transfer mechanism for the Bi-2223 may be different from that of the Bi-2212.