INTENSITY NOISE PROPERTIES OF ND-YVO4 MICROCHIP LASERS PUMPED WITH ANAMPLITUDE SQUEEZED DIODE-LASER

Authors
BECHER C BOLLER KJ
Citation
C. Becher et Kj. Boller, INTENSITY NOISE PROPERTIES OF ND-YVO4 MICROCHIP LASERS PUMPED WITH ANAMPLITUDE SQUEEZED DIODE-LASER, Optics communications, 147(4-6), 1998, pp. 366-374
Citations number
19
Categorie Soggetti
Optics
Journal title
Optics communications → ACNP
ISSN journal
00304018
Volume
147
Issue
4-6
Year of publication
1998
Pages
366 - 374
Database
ISI
SICI code
0030-4018(1998)147:4-6<366:INPONM>2.0.ZU;2-P
Abstract
We report on intensity noise measurements of single-frequency Nd:YVO4 microchip lasers optically pumped with amplitude squeezed light from a n injection-locked diode laser. Calibrated homodyne measurements show a minimum intensity noise of 10.1 dB above the SQL at a frequency of 1 00 kHz. The measured intensity noise spectra are described with high a ccuracy by a theoretical model based on the quantum mechanical Langevi n rate equations, including classical and quantum noise sources. (C) 1 998 Elsevier Science B.V.