CHARACTERIZATION OF FLAT AND BENT CRYSTALS FOR X-RAY SPECTROSCOPY ANDIMAGING

Authors
HOLZER G WEHRHAN O FORSTER E
Citation
G. Holzer et al., CHARACTERIZATION OF FLAT AND BENT CRYSTALS FOR X-RAY SPECTROSCOPY ANDIMAGING, Crystal research and technology, 33(4), 1998, pp. 555-567
Citations number
28
Categorie Soggetti
Crystallography
Journal title
Crystal research and technology → ACNP
ISSN journal
02321300
Volume
33
Issue
4
Year of publication
1998
Pages
555 - 567
Database
ISI
SICI code
0232-1300(1998)33:4<555:COFABC>2.0.ZU;2-P
Abstract
Theoretical and experimental methods for the characterization of the r eflection properties of flat and bent crystals are presented. The comp uter code DIXI for the simulation of reflection curves in the Bragg ca se is briefly described. Essential effects of the dynamical theory of x-ray diffraction are illustrated with selected examples. Results from diffractometric and topographic methods for quality control of bent c rystals are presented.