R. Kohler et al., NUCLEATION, GLIDE VELOCITY AND BLOCKING OF MISFIT DISLOCATIONS IN SIGE SI/, Crystal research and technology, 33(4), 1998, pp. 593-604
Relaxation of strained layer systems is still not well understood. It
is time dependent and changes considerably for samples with different
growth history. This has to be discussed in terms of nucleation, glide
velocity and blocking of misfit dislocations. We have investigated th
ese phenomena at samples with SiGe layer thicknesses ranging from 60 n
m up to 120 nm grown by molecular beam epitaxy (MBE) or chemical vapor
deposition (CVD) by means of X-ray topography. The samples were annea
led at temperatures between 500 degrees and 600 degrees C. Nucleation
of misfit dislocations is heterogeneous and the rate is obviously depe
ndent on layer strain and thickness. A quantified nucleation rate was
not yet accessible, mainly due to the preferential formation of disloc
ation bundles. The propagation velocities of misfit dislocation segmen
ts were measured during annealing by means of synchrotron radiation pl
ane wave topography (reflection geometry). The values agree well with
theory and there is no evidence that they depend on growth regime. It
is shown that the interaction of propagating misfit dislocations with
crossing ones may lead to blocking or cross slip in different glide sy
stems. These results are corroborated by investigations with atomic fo
rce and transmission electron microscopy.