MODE-COUPLING AND LEAKAGE EFFECTS IN FINITE-SIZE PRINTED INTERCONNECTS

Citation
L. Carin et al., MODE-COUPLING AND LEAKAGE EFFECTS IN FINITE-SIZE PRINTED INTERCONNECTS, IEEE transactions on microwave theory and techniques, 46(5), 1998, pp. 450-457
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
00189480
Volume
46
Issue
5
Year of publication
1998
Part
1
Pages
450 - 457
Database
ISI
SICI code
0018-9480(1998)46:5<450:MALEIF>2.0.ZU;2-0
Abstract
A multimode analysis is used to describe how leakage effects are manif ested in general printed interconnects situated on substrates of finit e size. In the vicinity of discrete frequencies, it is shown that the analysis reduces to classical coupled-mode theory. The general results are then specialized to the particular case of shielded microstrip on an anisotropic substrate, for which numerical and experimental mode-c oupling results are presented. The numerical results are demonstrated in the form of dispersion curves and field plots, and are computed usi ng the finite-element method and the spectral-domain technique. The ex perimental results are performed using a network analyzer, and are giv en in terms of scattering parameters.