PHOTOEMISSION-STUDY OF K DOPING ON A MONOLAYER OF C-60 ON CLEAN SI(001)-(2X1) SURFACE

Citation
Tw. Pi et al., PHOTOEMISSION-STUDY OF K DOPING ON A MONOLAYER OF C-60 ON CLEAN SI(001)-(2X1) SURFACE, Surface review and letters, 5(1), 1998, pp. 101-104
Citations number
21
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
ISSN journal
0218625X
Volume
5
Issue
1
Year of publication
1998
Pages
101 - 104
Database
ISI
SICI code
0218-625X(1998)5:1<101:POKDOA>2.0.ZU;2-6
Abstract
We present the first valence band photoemission study of a monolayer K xC60 on a clean Si(001)-(2 x 1) surface. The monolayer C-60 which show s weak interaction with the silicon surface reveals clear, but broaden ed, structures corresponding to bulk C-60 Upon K exposure, the work fu nction drops rapidly due to charge polarization toward the Si surface, considerably affecting then the rate of the LUMO filling. Its centroi d initially shown at 0.6 eV shifts to higher binding energy with highe r concentration. Moreover, the LUMO always separates 1.5 +/- 0.1 eV fr om the HOMO. Features associated with the many-body effect do not appe ar in the spectre. The Fermi cutoff has never been observed, indicatin g the insulating nature of the KxC60 surface.