SCANNING-TUNNELING-MICROSCOPY STUDY OF SINGLE-DOMAIN BETA-SIC(100) SURFACES - GROWTH AND MORPHOLOGY

Citation
F. Semond et al., SCANNING-TUNNELING-MICROSCOPY STUDY OF SINGLE-DOMAIN BETA-SIC(100) SURFACES - GROWTH AND MORPHOLOGY, Surface review and letters, 5(1), 1998, pp. 207-211
Citations number
21
Categorie Soggetti
Physics, Condensed Matter","Physics, Atomic, Molecular & Chemical","Material Science
Journal title
ISSN journal
0218625X
Volume
5
Issue
1
Year of publication
1998
Pages
207 - 211
Database
ISI
SICI code
0218-625X(1998)5:1<207:SSOSBS>2.0.ZU;2-5
Abstract
We investigate single domain beta-SiC(100) thin film surfaces epitaxia lly grown on a vicinal (4 degrees) Si(100) surface by atom-resolved (f illed and empty states) scanning tunneling microscopy (STM). Contrary to previous beliefs, we observe high quality surfaces having a low den sity of defects. The beta-SiC(100)-(3 x 2) surface, which is a Si-rich surface; is achieved by sequences of Si deposition and surface anneal ings. This results in the growth and coalescence of large Si islands a nd/or vacancies islands having the 3 x 2 array. Our results indicate t he formation of asymmetric Si-Si dimers all tilted in the same directi on and forming rows in a 3 x 2 arrangement at a 1/3 Si monolayer cover age.