LOCAL, NONVOLATILE ELECTRONIC WRITING OF EPITAXIAL PB(ZR0.52TI0.48)O-3 SRRUO3 HETEROSTRUCTURES/

Citation
Ch. Ahn et al., LOCAL, NONVOLATILE ELECTRONIC WRITING OF EPITAXIAL PB(ZR0.52TI0.48)O-3 SRRUO3 HETEROSTRUCTURES/, Science, 276(5315), 1997, pp. 1100-1103
Citations number
20
Categorie Soggetti
Multidisciplinary Sciences
Journal title
ISSN journal
00368075
Volume
276
Issue
5315
Year of publication
1997
Pages
1100 - 1103
Database
ISI
SICI code
0036-8075(1997)276:5315<1100:LNEWOE>2.0.ZU;2-F
Abstract
A scanning probe microscope was used to induce local, nonvolatile fiel d effects in epitaxial, ferroelectric Pb(Zr0.52Ti0.48)O-3/SrRuO3 heter ostructures. Field-effected regions with linewidths as small as 3500 a ngstroms were written by locally switching the polarization field of t he Pb(Zr0.52Ti0.48)O-3 layer; the electronic density of the underlying metallic SrRuO3 layer was modified and the sheet resistance was chang ed by up to 300 ohms per square. This procedure is completely reversib le and allows submicrometer electronic features to be written directly in two dimensions, with no external electrical contacts or lithograph ic steps required.