T. Osaka et al., PHASE-TRANSITION IN FERROELECTRIC SRBI2TA2O9 THIN-FILMS WITH CHANGE OF HEAT-TREATMENT TEMPERATURE, JPN J A P 1, 37(2), 1998, pp. 597-601
Changes in the composition and the crystal structure of micro-grains h
ave been studied using transmission electron microscopy (TEM) and ener
gy dispersive X-ray microanalysis in order to clarify the phase format
ion of ferroelectric SrBi2Ta2O9 (SBT) with heat-treatment at 650-750 d
egrees C. Micrograins crystallized at 650 degrees C begin to change to
bismuth-layer-structure-family (BLSF) grains at temperatures exceedin
g 700 degrees C, and form pure-BLSF phase grains at 800 degrees C, Hen
ce, a micrograins phase exists in thin films at 650-750 degrees C and
we determined that the bismuth composition in these grains decreases.
Using selected diffraction and high-resolution TEM, we found that a py
rochlore phase was formed in the bismuth-poor micrograins that were he
at treated at 750 degrees C, The formation of pyrochlore made pure-pha
se BLSF difficult to obtain.