DIRECT MAPPING OF RECIPROCAL LATTICE RODS OF METAL-INDUCED FACET ON SI(001) SURFACE

On Si(001) surfaces annealed at 700 degrees C after the deposition of 1.5 monolayer (ML) or Ba at room temperature, facet spots were observe d in addition to the 2 x 1 pattern of the Si(001) clean surface. These patterns were recorded using a TV camera and stored in a personal com puter as an image. Line profiles were obtained on the line along which the facet spot moved. From these profiles the peak position of facet spots was extracted and superposed on a reciprocal lattice space to co nstruct reciprocal lattice rods. From the angle of these rods to those of the Si(001) substrate, the facet is indicated to be a metal-induce d Si(113) face.