SUBWAVELENGTH IMAGING BY DEPOLARIZATION IN A REFLECTION NEAR-FIELD OPTICAL MICROSCOPE USING AN UNCOATED FIBER PROBE

We present a reflection scanning near-field optical microscope utilizi ng counter-directional light propagation in an uncoated fiber probe, c ross-polarized detection and shear-force feedback. Topographical and n ear-field optical imaging with a scanning speed of up to 10 mu m/s and a lateral resolution better than 40 nm are demonstrated with a latex projection test sample. Determination of the optical resolution as wel l as correlation between topographical and near-field optical images a re discussed. (C) 1998 Elsevier Science B.V.