Sa. Chizhik et al., LEVELS OF TOPOGRAPHY IN MECHANICS OF PRECISION JOINTS, International journal of machine tools & manufacture, 38(5-6), 1998, pp. 495-502
Characterizing even very smooth surfaces it is necessary to take into
account multilevel structure of topography. By methods of stylus profi
lometry and atomic force microscopy (AFM) roughness of hard magnetic d
isk substrates textured under different regimes was measured. It is sh
own that the methods reflect various levels of roughness with overlapp
ing ranges of wave lengths. Quantitative parameters for each roughness
level suitable for the subsequent modeling of an actual contact zone
were determined. To reduce influence of the roughness' long-wave compo
nents on the relief parameters at a small-scale level, computer proces
sing of the AFM-images was performed. For the description of the actua
l contact area hybrid two-level model was offered. The Greenwood-Willi
amson scheme using the profilometry data and complemented by the accou
nt of superficial forces influence was used at a microlevel. Computer
simulation of a contact on a database of AFM-image of a surface was us
ed at submicrolevel. Influence of the contact area discreteization at
a microlevel on a degree of submicroasperities deformation was taken i
nto account. Visualization of the real contact area was performed. Dis
tinctions in the operational characteristics of surfaces depending on
their texturing modes was shown. (C) 1998 Elsevier Science Ltd.