STRUCTURAL INVESTIGATION OF I(2)S-CENTER-DOT-0.4SIS(2))CENTER-DOT-5LI(4)SIO(4) OXYSULFIDE GLASS BY USING X-RAY PHOTOELECTRON-SPECTROSCOPY

Citation
A. Hayashi et al., STRUCTURAL INVESTIGATION OF I(2)S-CENTER-DOT-0.4SIS(2))CENTER-DOT-5LI(4)SIO(4) OXYSULFIDE GLASS BY USING X-RAY PHOTOELECTRON-SPECTROSCOPY, Journal of the American Ceramic Society, 81(5), 1998, pp. 1305-1309
Citations number
19
Categorie Soggetti
Material Science, Ceramics
Volume
81
Issue
5
Year of publication
1998
Pages
1305 - 1309
Database
ISI
SICI code
Abstract
S2p and Ols photoelectron spectra were obtained for the 95(0.6Li(2)S . 0.4SiS(2)). 5Li(4)SiO(4) oxysulfide glass prepared by twin-roller que nching. A four-peak deconvolution technique was used to separate the S 2p peak of the glass into the components of bridging and nonbridging s ulfur atoms. As a result of the deconvolution of the S2p peak, we foun d that similar to 92% of the sulfur atoms were present as nonbridging atoms. The Ols peak of the glass was separated into two components: br idging and nonbridging oxygen atoms, This separation of the Ols peak i ndicated that similar to 85% of the oxygen atoms were present as bridg ing oxygen atoms.