MICROSTRUCTURE AND DIELECTRIC-PROPERTIES OF YMNO3 THIN-FILMS PREPAREDBY DIP-COATING

YMnO3 thin films with Y/Mn ratios from 1.00/1.05 to 1.00/0.90 were pre pared by dip-coating from solution, in which starting materials were r efluxed, and the effects of the Y/Mn ratio on the structure and dielec tric properties of YMnO3 thin films were investigated. XRD measurement s indicated that the films with the Y/Mn ratios in this study were a s ingle phase of polycrystalline YMnO3. The lattice constants along the a-axis and c-axis lengthened with an increase in the Y/Mn ratio. FE-SE M micrographs of the films showed that the surface of the films became smoother and denser with an increase in the Y/Mn ratio. YMnO3 thin fi lms with good dielectric properties were obtained with an Y/Mn ratio o f 1.00/0.90, which gave the smoothest and densest microstructure and t he smallest leakage current.