PHOTOSENSITIVITY OF THIN-FILM STRUCTURES BASED ON LASER-DEPOSITED CUIN(TEXSE1-X)(2) LAYERS

Thin films of the solid solutions CuIn(TexSe1-x)(2) (0<x<1) exhibiting chalcopyrite structure were obtained by the method of laser depositio n. Using half-transmitting indium layers, Schottky diodes were prepare d on the basis of the films obtained. The spectral dependence of the s ensitivity as a function of the ratio between Te and Se was investigat ed by illuminating the structures through the In contact. Analysis of the experimental results showed that the region of spectral sensitivit y of such thin-film structures depends on the tellurium content in the CuIn(TexSe1-x)(2) layers. (C) 1998 American Institute of Physics.