SCATTERING CONTRIBUTION OF FLUORESCENT RADIATION TO XRF INTENSITY IN GE(LI) DETECTORS

Citation
R. Durak et al., SCATTERING CONTRIBUTION OF FLUORESCENT RADIATION TO XRF INTENSITY IN GE(LI) DETECTORS, Physica scripta. T, 55(5), 1997, pp. 547-549
Citations number
19
Categorie Soggetti
Physics
Journal title
ISSN journal
02811847
Volume
55
Issue
5
Year of publication
1997
Pages
547 - 549
Database
ISI
SICI code
0281-1847(1997)55:5<547:SCOFRT>2.0.ZU;2-Y
Abstract
In-sample scattering contribution of fluorescent radiation to the X-ra y fluorescence line intensity were studied in thick, pure samples. The Compton peak/photopeak area ratios for pure elements Cu, Zr, Ag, Sn, Ba, Gd, Dy and Yb were determined as a function of characteristic X-ra y energy and sample thickness for annular-shaped Am-241 isotope excita tion. The results show that the contribution of scattering is within 2 -15% of the primary fluorescence. The results were compared with theor etical results.