A scanning near-field optical microscope combined with a scanning tunn
eling microscope is designed for studying sample surfaces and modifyin
g their properties. A single-mode optical fiber adiabatically narrowed
to an aperture of 30-100 nm and coated with a metal layer is used as
a microprobe. The microscope probe, kept above the sample surface, is
controlled by a tunnel-current-based feedback loop, allowing optical a
nd electron images to be obtained simultaneously.