A PROBE FOR A NEAR-FIELD SCANNING OPTICAL MICROSCOPE

Authors
DRYAKHLUSHIN VF KLIMOV AY ROGOV VV GUSEV SA
Citation
Vf. Dryakhlushin et al., A PROBE FOR A NEAR-FIELD SCANNING OPTICAL MICROSCOPE, Instruments and experimental techniques, 41(2), 1998, pp. 275-276
Citations number
5
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Instruments and experimental techniques → ACNP
ISSN journal
00204412
Volume
41
Issue
2
Year of publication
1998
Pages
275 - 276
Database
ISI
SICI code
0020-4412(1998)41:2<275:APFANS>2.0.ZU;2-Y
Abstract
A technique for the fabrication of probes for a near-field scanning op tical microscope is described. Probes are based on a single-mode optic al fiber adiabatically tapered with the chemical etching technique. Th e advantages of such probes are described.