Quadrature detection techniques have been applied to images obtained f
rom a Mach-Zehnder interferometer with differently polarized beams to
yield the real and the imaginary parts of the diffracted fields simult
aneously. This approach eliminates the need for phase retrieval by pro
viding complete information on the complex amplitude of the diffracted
signal. We present results in which we demonstrate our ability to rec
onstruct two-and three-dimensional microscopic objects from their comp
lex diffraction patterns. (C) 1998 Optical Society of America.