A. Iller et al., POLARITY IDENTIFICATION OF GAN BULK SINGLE-CRYSTALS (0001) SURFACE BYAUGER-ELECTRON SPECTROSCOPY, Crystal research and technology, 32(2), 1997, pp. 229-233
An attempt to identify the polarity of (0001) polar surface of GaN bul
k single crystals grown by high nitrogen pressure solution method has
been made using Auger electron spectroscopy (AES). AES concentration d
epth profiles of the top layer in (0001) direction starting from both
(0001) faces of the sample have been measured. Distinct difference in
the Ga concentration at the sample surface of both faces has been obse
rved. The dependence of Ga concentration on depth is also different fo
r both faces of the sample.