Ak. Guha et al., X-RAY LANG TOPOGRAPHY AND INFRARED-SPECTROSCOPY IN QUARTZ CRYSTALS GROWN HYDROTHERMALLY WITH INTERMITTENT RUNS, Crystal research and technology, 32(2), 1997, pp. 329-337
Growth defects in Y-plates obtained from Y-bar synthetic quartz crysta
ls, grown hydrothermally with intermittent runs, have been studied for
the first time by X-rag Lang topography and infrared spectroscopy. To
study the effect of interfaces on dislocation structures, the growth
I uns have been discontinued several (6 to 7) times by switching off t
he autoclaves from 30 min to 1 h. The dislocations were observed to ch
ange their directions at the generated interfaces, sometimes they stop
at the interfaces or move straight through the interfaces depending o
n the angles of the interfaces which are presumably low-angle grain bo
undaries. The percentage transmission of infrared beam has also been m
easured as a function of the distance traversed in the crystal. ?he in
verse anelastic loss (Q) decreases at the interface which is due to th
e greater accumulation of chemical impurities and H bonded OH- ions at
these interfaces. The effect of in-situ electric field on the topogra
phic contrast has also been studied which reveal some interesting resu
lts on account of space charge polarization.