DETERMINATION OF OXYGEN ATOMIC POSITIONS IN A GA-IN-SN-O CERAMIC USING DIRECT-METHODS AND ELECTRON-DIFFRACTION

Direct methods using dynamical transmission electron diffraction (TED) intensities is applied to the solution of (Ga,In)(2)SnO5. Dynamical d iffraction effects in the TED data lead to an emphasis of oxygen posit ions in the structure. Application of direct methods to dynamical diff raction intensities represents a valuable new technique for obtaining approximate atom positions of light elements in ceramics using an expe riment which is simple to perform and does not require a single crysta l. (C) 1998 Academic Press.