The initial stages of homoepitaxial island formation on Si(100)2 x 1 b
y SiH4 decomposition under ultra high vacuum chemical vapor deposition
conditions are studied by scanning tunneling microscopy and kinetic m
odel calculations. The concentrations of the intermediate species form
ed on the surface during SiH4 decomposition are calculated from the ki
netic parameters of the dissociation cascade leading to Si Blm growth
in the temperature regime of 500 to 800 K and for SiH4 pressures in th
e range of 2 x 10(-7) to 2 x 10(-5) mbar. Experimental results showing
the surface topography after interaction with SiH4 at various surface
temperatures and deposition rates are presented, and the observed sur
face structures are related to the different surface conditions, i.e.,
deposition flux and sample temperature, under which islands are forme
d.