ATOMIC-FORCE MICROSCOPE NANOFABRICATION OF INAS ALGASB HETEROSTRUCTURES/

Citation
S. Sasa et al., ATOMIC-FORCE MICROSCOPE NANOFABRICATION OF INAS ALGASB HETEROSTRUCTURES/, JPN J A P 1, 36(6B), 1997, pp. 4065-4067
Citations number
7
Volume
36
Issue
6B
Year of publication
1997
Pages
4065 - 4067
Database
ISI
SICI code
Abstract
We employ an atomic force microscope (AFM) for the fabrication of InAs /Al(Ga)Sb nanostructures. In order to make nanoscale modifications in the two-dimensional electron gas (2DEG) system, we apply an AFM oxidat ion process for GaSb, for the first time. We found that the oxidation of GaSb occurs for tip voltages over 7-8 V and that the oxidized GaSb region can be selectively removed by immersion in water for 10 min. We successfully fabricate a lateral periodic structure on the GaSb cap l ayer using AFM oxidation with a 0.3 mu m spacing. The induced increase in the 2DEG concentration is as high as 80% due to the surface modifi cation. The magnetotransport measurement also implies structural modif ication of the 2DEG system.