MICROMECHANICAL PROPERTIES OF ELASTIC POLYMERIC MATERIALS AS PROBED BY SCANNING FORCE MICROSCOPY

Citation
Sa. Chizhik et al., MICROMECHANICAL PROPERTIES OF ELASTIC POLYMERIC MATERIALS AS PROBED BY SCANNING FORCE MICROSCOPY, Langmuir, 14(10), 1998, pp. 2606-2609
Citations number
24
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
07437463
Volume
14
Issue
10
Year of publication
1998
Pages
2606 - 2609
Database
ISI
SICI code
0743-7463(1998)14:10<2606:MPOEPM>2.0.ZU;2-C
Abstract
Scanning force microscopy (SFM) was used for probing micromechanical p roperties of compliant polymeric materials. Classic models of elastic contacts, Sneddon's, Hertzian, and JKR, were tested for various indent ation depths and for a variety of polymeric materials. We selected ext remely compliant polyisoprene rubbers (Young's modulus, E = 1-3 MPa), elastic polyurethanes (E = 5-50 MPa), and hard surfaces of polystyrene (PS) and polyvinylchloride (PVC) (E = 1-5 GPa). Both Sneddon's and He rtzian elastic models gave consistent and reliable results in the rang e of indentation depths up to 200 nm which are close to JKR solution. Close correlation is observed between absolute values of elastic modul i determined by SFM and known values for bulk materials.