Sa. Chizhik et al., MICROMECHANICAL PROPERTIES OF ELASTIC POLYMERIC MATERIALS AS PROBED BY SCANNING FORCE MICROSCOPY, Langmuir, 14(10), 1998, pp. 2606-2609
Scanning force microscopy (SFM) was used for probing micromechanical p
roperties of compliant polymeric materials. Classic models of elastic
contacts, Sneddon's, Hertzian, and JKR, were tested for various indent
ation depths and for a variety of polymeric materials. We selected ext
remely compliant polyisoprene rubbers (Young's modulus, E = 1-3 MPa),
elastic polyurethanes (E = 5-50 MPa), and hard surfaces of polystyrene
(PS) and polyvinylchloride (PVC) (E = 1-5 GPa). Both Sneddon's and He
rtzian elastic models gave consistent and reliable results in the rang
e of indentation depths up to 200 nm which are close to JKR solution.
Close correlation is observed between absolute values of elastic modul
i determined by SFM and known values for bulk materials.