The characterization of particles, especially aerosol particles, is of
great importance to many scientific fields, A relevant brief overview
is given, A rigorous scheme of sampling and in-depth characterization
of particulate samples has been developed in the authors' laboratorie
s and by collaborative groups, including investigations by the followi
ng techniques: total reflection X-ray fluorescence spectrometry for qu
antitative bulk characterization; solid-state speciation by valence ba
nd X-ray spectrometry using electron microprobe or Mossbauer spectrome
try (only bulk particle characterization possible); scanning electron
microscopy and electron probe microanalysis for automatic semiquantita
tive single particle characterization of particles greater than or equ
al to 0.5 mu m; transmission electron microscopy for semiquantitative
single particle characterization of particles with diameters down to 1
0 nm; high resolution-scanning electron microscopy, which is also capa
ble of characterizing particles morphologically and qualitatively down
to 10 nm in diameter; secondary ion mass spectrometry for the study o
f trace elemental distributions and isotopic ratios in particles with
diameters above 1 mu m, It is the aim of this paper to show the advant
ages and characteristics of this scheme of analysis to match today's r
equirements for topochemical methods of analysis. For this purpose a s
hort overview of these methods for particle characterization is also p
resented.