DIRECT CHARACTERIZATION OF ULTRAVIOLET-LIGHT-INDUCED REFRACTIVE-INDEXSTRUCTURES BY SCANNING NEAR-FIELD OPTICAL MICROSCOPY

Authors
SVALGAARD M MADSEN S HVAM JM KRISTENSEN M
Citation
M. Svalgaard et al., DIRECT CHARACTERIZATION OF ULTRAVIOLET-LIGHT-INDUCED REFRACTIVE-INDEXSTRUCTURES BY SCANNING NEAR-FIELD OPTICAL MICROSCOPY, IEEE photonics technology letters, 10(6), 1998, pp. 848-850
Citations number
16
Categorie Soggetti
Optics,"Physics, Applied
Journal title
IEEE photonics technology letters → ACNP
ISSN journal
10411135
Volume
10
Issue
6
Year of publication
1998
Pages
848 - 850
Database
ISI
SICI code
1041-1135(1998)10:6<848:DCOUR>2.0.ZU;2-4
Abstract
We have applied a reflection scanning near-field optical microscope to directly probe ultraviolet (UV)-light-induced refractive index struct ures in planar glass samples. This technique permits direct comparison between topography and refractive index changes (10(-5)-10(-3)) with submicrometer lateral resolution, The proposed method yields detailed information about the topography and index profiles of UV-written wave guides.