PHOTO-ASSISTED METALLIZATION - LINE RESOLUTION STUDIES

Citation
Ej. Lafferty et al., PHOTO-ASSISTED METALLIZATION - LINE RESOLUTION STUDIES, Surface & coatings technology, 101(1-3), 1998, pp. 80-84
Citations number
8
Categorie Soggetti
Materials Science, Coatings & Films
ISSN journal
02578972
Volume
101
Issue
1-3
Year of publication
1998
Pages
80 - 84
Database
ISI
SICI code
0257-8972(1998)101:1-3<80:PM-LRS>2.0.ZU;2-E
Abstract
Photo-activation processes for electroless plating have the potential for linewidth resolution on a scale of the order of 10 mu m or less, d epending on the substrate surface morphology and plating conditions. T his work presents the first AFM and linewidth resolution study of insu lating substrates selectively activated using a purpose-built KrCl ex cimer lamp contact mask aligner with proprietary photochemical activat ion precursors having optimum Photoactivity at the excimer lamp wavele ngth. The surface morphology of a photodefined activation layer on cer amics of varying surface topography, and on highly orientated pyrolyti c graphite (HOPG), was investigated using atomic force microscopy. The subsequent nucleation and growth of the electroless metallisation on 96% alumina were also studied. The minimum achievable resolution of th e subsequent electroless copper metallisations on alumina ceramic subs trates is evaluated. (C) 1998 Elsevier Science S.A.