STUDY OF CHARGED DEFECTS IN CDTE AND CDHG TE BY SCANNING ELECTRON ANDTUNNELING MICROSCOPY TECHNIQUES

Authors
PANIN GN DIAZGUERRA C PIQUERAS J
Citation
Gn. Panin et al., STUDY OF CHARGED DEFECTS IN CDTE AND CDHG TE BY SCANNING ELECTRON ANDTUNNELING MICROSCOPY TECHNIQUES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 461-466
Citations number
19
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa → ACNP
ISSN journal
03676765
Volume
62
Issue
3
Year of publication
1998
Pages
461 - 466
Database
ISI
SICI code
0367-6765(1998)62:3<461:SOCDIC>2.0.ZU;2-2