X-RAY-MICROANALYSIS OF HIGH-RESISTIVITY S AMPLES

Authors
MOSHNIKOV VA RUMJANTSEVA AI RYBNIKOV AI
Citation
Va. Moshnikov et al., X-RAY-MICROANALYSIS OF HIGH-RESISTIVITY S AMPLES, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 552-554
Citations number
2
Categorie Soggetti
Physics
Journal title
Izvestia Akademii nauk SSSR. Seria fiziceskaa → ACNP
ISSN journal
03676765
Volume
62
Issue
3
Year of publication
1998
Pages
552 - 554
Database
ISI
SICI code
0367-6765(1998)62:3<552:XOHSA>2.0.ZU;2-T