S. Ohshima et al., OBSERVATION OF VORTEX MOVEMENTS IN A BI2212 SINGLE-CRYSTAL UNDER APPLICATION OF A TRANSPORT CURRENT BY MEANS OF THE BITTER PATTERN TECHNIQUE, JPN J A P 2, 37(4A), 1998, pp. 375-378
The high-resolution Bitter pattern technique has been used to observe
vortex movements of Bi2Sr2CaCu2Oy single crystals. A transport current
is applied to the sample parallel to the ab plane, and a de magnetic
field is applied normal to the nb plane at the Ni decoration. The Ni d
ecoration pattern can be observed using a scanning electron microscope
(SEM) and an atomic force microscope (AFM). Through observation of th
e Ni pattern, we can identify vortex movements while the transport cur
rent is being applied. The vortices move randomly with a small transpo
rt current of less than 40% of J(c), and they move in a line with a la
rge transport current nearly equal to J(c). The vortex movement was no
t observed in the sample on applying a transport current larger than 1
.5 J(c).