Ai. Gusev et al., IMPROVEMENT OF SIGNAL INTENSITIES IN STATIC SECONDARY-ION MASS-SPECTROMETRY USING HALIDE ADDITIVES AND SUBSTRATE MODIFICATION, Journal of mass spectrometry., 33(5), 1998, pp. 480-485
A new approach is reported for secondary-ion time-of-flight mass spect
rometry (TOF-SIMS) sample preparation. The method involves the use of
halide additives or halide modification of silver substrate surfaces t
o promote analyte cationization and protonation. The enhancement of si
gnal intensity has been demonstrated for neutral organic lipophilic an
d hydrophilic compounds including various small peptides and nucleosid
es. Improvement factors range from 2-30 for cationized species to 20-2
000 for protonated species. However, the new sample preparation does n
ot affect the signal intensities of preformed ionic species. The sampl
e preparation approach is applicable to a wide variety of neutral comp
ounds and should find broad use for organic analysis by TOF-SIMS. (C)
1998 John Wiley & Sons, Ltd.